Neural Engineering

Transformative Technologies

NETT Summer School

This one week conference, taking place between 1st and 5th July, will bring together international experts to discuss the state of the art in the field of Neural Engineering. It will also include a number of tutorial presentations for those new to the field as well as presentations and training sessions from industrial companies National Instruments and Brain Products.

Conference organisers:

Stephen  Coombes, University of Nottingham
Wolfram Erlhagen, University of Minho
Jordi Garcia- Ojalvo, Polytechnic University of Catalonia
Bert Kappen, Radboud University Nijmegen

Final Programme (PDF)

Invited speakers:

Michela Chiappalone (Fondazione Istituto Italiano di Tecnologia (IIT), Genova)
Jan Danckhaert (Vrije Universiteit Brussels, Belgium)

Dominique Durand (Case Western Reserve University, USA)
Chris Eliasmith (University of Waterloo, Canada)
Wolfram Erlhagen (University of Minho, Portugal)
Ingo Fischer (University of the Balearic Isles, Spain)
David Grayden (University of Melbourne, Australia)
Antonio Hurtado (University of New Mexico, USA)
Bert Kappen (Radboud University Nijmegen, Netherlands)
Eduardo Miranda (University of Plymouth, UK)

John Van Opstal (Radboud University Nijmegen, Netherlands)
Antonio Pons (Polytechnic University of Catalonia, Spain)
Steve Schiff (Penn State University, USA)

Alessandro Torcini (CNR Institute of Complex Systems, Italy)
Marc Timme (MPI Göttingen, Germany)

The meeting will consist of talks from invited speakers and existing members of NETT. There is space to accommodate a further 50 participants and the schedule will allow for a number of poster presentations. The deadline for application to attend by non NETT members is 14th June 2013. The registration fee for non NETT members is £100. Link to registration page.

Talks will be in room C27 of the Physics building, number 22 on
this map. Further campus directions are here.
Some of the presentations given are available on the Training page and there is additional material available in the Internal sec ion (accessible only via log in).